This course on Electron Microscopy (E/M) aims to introduce students of the Physics and other departments to the basic concepts of E/M starting from basic principles of Geometric and Physical optics and extending to study and operational principles of the Scanning Electron Microscope (SEM), the Transmission Electron Microscope (TEM) and the Atomic Force Microscope (AFM), including pumping and vacuum procedures and fundamentals of image formation. It also covers the subjects of qualitative and quantitative microanalysis (ZAF method) and electron diffraction. The class is concluding with an “on-hands” lab practice of students on techniques for the preparation and observation/analysis of various inorganic and organic samples.
Monday, 9:00-11:00, Room 3
Thusday, 9:00-11:00, Amphitheater ST
General principles: Geometric and Physical optics- Imaging-Lenses- Simple/ stereoscopic microscope- Apertures- Resolution/Airy disc.
The evolution of microscope: E/M radiation-Electron waves-X-ray microscope- magnetic lenses.
Existing types of E/Ms: TEM-TEM/R-STEM-SEM-EXMA
Fluorescence: Electron emission and ion emission Microscopes
Principles of magnetic lenses: Structure- Hysteresis- Faults- Depth of focus-Depth of fieldImaging and contrast: Sample preparation- observation processing- diffraction-Mass density- absorption-apertures- noise
Vacuum principles: Basic concepts- Theory of gas motion-application to pumping systems-operation of pumps- vacuum formation techniques- vacuum theory and technology- instrumentation- designing a vacuum system
The TEM: Introductory principles- apertures- lenses- imaging system
Cristalline structure: Bravais structures- Miller indexes- defects
Electron Diffraction: Bragg’s law, Imaging and analyses- crystalline structures- structural and planar defects- thin films
The SEM: Introductory- sample preparation- imaging and analysis processing- phase contrast- EBIC method- applicationsIntroduction to Electron Microanalysis: X-rays production, spectrum, characteristic lines, analysis methods- topography- detection systems- EDS,WDS- imaging and related problems
Qualitative and Quantitative microanalysis: ZAF method- Energy spectra- Kz ,Ka, Kf coefficientsApplications: Lab exercises / practical “on-hand” experience on sample preparation (use of optical stereoscope/ plasma deposition) and the use of SEM / TEM
Course notes «Electron Microscopy» - G. Kiriakidis, V. Binas (2014)
http://ph277.edu.physics.uoc.gr/files/Electron_Microscopy_Notes_VBinas2.pdf
Textbooks:
«Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM» - Ray Egerton (2005)
«Transmission Electron Microscopy: A Textbook for Materials Science» - D.B. Williams, C.B. Carter - Plenum Press, New York, (1996)
